The Novolever: A new cantilever for scanning force microscopy microfabricated from polymeric materials
- 1 December 1994
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 65 (12) , 3702-3706
- https://doi.org/10.1063/1.1144495
Abstract
A new force sensor element based on multilayer thin film technology and adapted for optical readout in a conventional scanning force microscope has been developed. The use of polymers as cantilever materials enables the introduction of mechanical properties otherwise not accessible with microfabrication based on Si technology. The fully batched fabricated cantilevered force transducer is based on the photoresist novolak and incorporates an integrated EBD tip. Bending experiments on microstructures indicate that the Young’s modulus of novolak is about two orders of magnitude lower than for Si. Therefore, in using a cantilever design similar to that with Si it is possible to fabricate more flexible structures from polymeric materials. The new force sensors have been tested and their performance has been evaluated on different samples.Keywords
This publication has 10 references indexed in Scilit:
- Adhesion Forces Between Individual Ligand-Receptor PairsScience, 1994
- Ultrahigh resolution magnetic force microscope tip fabricated using electron beam lithographyJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1993
- Surface morphology and stability of Langmuir-Blodgett mono- and multilayers of saturated fatty acids by scanning force microscopyLangmuir, 1993
- Imaging viscoelasticity by force modulation with the atomic force microscopeBiophysical Journal, 1993
- Friction force microscopy of mixed Langmuir-Blodgett filmsThin Solid Films, 1992
- Imaging steep, high structures by scanning force microscopy with electron beam deposited tipsSurface Science, 1992
- Contraction of Small Features in Hardened Thin Films of NovolakBerichte der Bunsengesellschaft für physikalische Chemie, 1991
- Micromachined silicon sensors for scanning force microscopyJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1991
- Microfabrication of cantilever styli for the atomic force microscopeJournal of Vacuum Science & Technology A, 1990
- Atomic resolution with the atomic force microscope on conductors and nonconductorsJournal of Vacuum Science & Technology A, 1988