Structure and concepts for current-based analog scan
- 19 November 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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- Built-in self-test structure for mixed-mode circuitsIEEE Transactions on Instrumentation and Measurement, 1993
- Built-in self-test (BIST) structure for analog circuit fault diagnosisIEEE Transactions on Instrumentation and Measurement, 1990