Multifrequency testability analysis for analog circuits

Publisher Website

17 December 2002

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 54-59
https://doi.org/10.1109/vtest.1994.292334

Abstract

No abstract available

Keywords

This publication has 8 references indexed in Scilit:

Analog circuit fault diagnosis based on sensitivity computation and functional testing
IEEE Design & Test of Computers, 1992
Analog network testability measurement: a symbolic formulation approach
IEEE Transactions on Instrumentation and Measurement, 1991
Testability analysis of analog systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1990
Improvements to numerical testability evaluation
IEEE Transactions on Instrumentation and Measurement, 1987
Multifrequency measurement of testability with application to large linear analog systems
IEEE Transactions on Circuits and Systems, 1986
Fault diagnosis for linear systems via multifrequency measurements
IEEE Transactions on Circuits and Systems, 1979
Large-change sensitivities of linear digital networks
IEEE Transactions on Circuits and Systems, 1978
Conditions for Network-Element-Value Solvability
IRE Transactions on Circuit Theory, 1962