Origin and development of residual stresses in the NiNiO system: in-situ studies at high temperature by X-ray diffraction
- 1 January 1993
- journal article
- Published by Elsevier in Materials Science and Engineering: A
- Vol. 160 (1) , 113-126
- https://doi.org/10.1016/0921-5093(93)90504-8
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
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