Carbon dependence of Raman mode frequencies in Si1xyGexCy alloys

Abstract
The frequencies of the Si-Si, Si-Ge, and Ge-Ge Raman modes in Si1xy Gex Cy alloys with y⩽0.03 have been measured. All frequencies are found to increase as a function of the carbon concentration. Within experimental error, this dependence is linear with a large slope, which can be explained qualitatively in terms of the large bond distortions caused by the lattice mismatch between Si1x Gex and diamond. Good numerical agreement with theoretical predictions is obtained if the mode frequencies are plotted as a function of the substitutional carbon fraction determined from Rutherford backscattering studies. For the ‘‘Si-Si’’ mode, the magnitude of the carbon contribution to the bond-distortion dependence of the Raman frequency shift is found to be 15 times larger than the Ge contribution. This disagrees with the 8-to-1 strain compensation ratio predicted form Vegard’s law, but agrees well with theoretical predictions of this ratio. © 1996 The American Physical Society.