Widely extended new method for measuring the impedance (C/sub x/R/sub x/) at high frequencies with applications
- 1 January 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 38 (1) , 64-73
- https://doi.org/10.1109/19.20000
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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- On the New Method of Measuring Dielectric Constant and Loss Angles of SemiconductorsJournal of Applied Physics, 1953