Built-in self-diagnosis for repairable embedded RAMs
- 1 June 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Design & Test of Computers
- Vol. 10 (2) , 24-33
- https://doi.org/10.1109/54.211525
Abstract
A method of built-in self-diagnosis (BISD) for repairable, embedded static RAMs (SRAMs) is presented. The BISD circuit, with self-repair, requires about 5% extra area in a 64-kb SRAM. The circuit contains a small reduced-instruction-set processor, which executes diagnosis algorithms stored in a ROM. These algorithms employ hybrid serial/parallel operations when external repair is available or modular operations when self-repair is required. The algorithms, hardware design, and design costs and tradeoffs are discussed.<>Keywords
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