LBIC and diffusion length mapping applied to the investigation of gettering by aluminium diffusion in multicrystalline silicon
- 31 May 1994
- journal article
- Published by Elsevier in Materials Science and Engineering: B
- Vol. 24 (1-3) , 188-191
- https://doi.org/10.1016/0921-5107(94)90325-5
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Combined effect of aluminium diffusion and annealing on GB properties in cast polysiliconSolar Energy Materials and Solar Cells, 1993
- Mapping of the local minority carrier diffusion length in silicon wafersApplied Surface Science, 1993
- Low temperature gettering of Cu, Ag, and Au across a wafer of Si by AlApplied Physics Letters, 1982
- A new electric field effect in silicon solar cellsJournal of Applied Physics, 1973