Damage-induced high-resistivity regions in Al0.48In0.52As

Abstract
The sheet resistivity of oxygen‐implanted n+‐Al0.48In0.52As grown on InP was measured as a function of oxygen ion dose and post‐implant annealing temperature. The sheet resistivity is >105 Ω/⧠ after implantation for doses in the range 1012–8×1013 cm2, and increases to >107 Ω/⧠ after annealing at 500 °C. Temperature‐dependent Hall measurements show that the resistivity of this compensated AlInAs has a thermal activation energy of 0.68 eV. Above 600 °C the damage‐related compensation is removed and the material is returned to its original resistivity. We find no thermally stable, oxygen‐related deep acceptors in AlInAs, in contrast to the results for AlGaAs.