Study of DLC/silicon interfaces by XPS and in-situ ellipsometry
- 1 May 1993
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 68 (1) , 149-160
- https://doi.org/10.1016/0169-4332(93)90224-y
Abstract
No abstract availableThis publication has 19 references indexed in Scilit:
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