Optical and structural characterization of boron nitride thin films
- 1 May 1995
- journal article
- Published by Elsevier in Diamond and Related Materials
- Vol. 4 (5-6) , 657-660
- https://doi.org/10.1016/0925-9635(94)05275-1
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Ellipsometric study of boron nitride thin-film growth on Si(100)Applied Physics Letters, 1993
- Structural characterization of preferentially oriented cubic BN films grown on Si (001) substratesThin Solid Films, 1993
- Growth of cubic boron nitride from vapor phaseDiamond and Related Materials, 1992
- Ellipsometric study of diamond-like thin filmsSurface and Coatings Technology, 1991
- Real time controlled rf reactor for deposition of a-Si:H thin filmsVacuum, 1989
- Preparation, properties and applications of boron nitride thin filmsThin Solid Films, 1988
- Optical properties of pyrolytic boron nitride in the energy range 0.05—10 eVPhysical Review B, 1984
- Lattice Infrared Spectra of Boron Nitride and Boron MonophosphidePhysical Review B, 1967
- Normal Modes in Hexagonal Boron NitridePhysical Review B, 1966
- Berechnung verschiedener physikalischer Konstanten von heterogenen Substanzen. I. Dielektrizitätskonstanten und Leitfähigkeiten der Mischkörper aus isotropen SubstanzenAnnalen der Physik, 1935