Testing systems on a chip
- 1 November 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Spectrum
- Vol. 33 (11) , 42-47
- https://doi.org/10.1109/6.542274
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Macro Testability; The Results of Production Device ApplicationsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- A universal framework for managed built-in testPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A tutorial on built-in self-test. I. PrinciplesIEEE Design & Test of Computers, 1993