A tutorial on built-in self-test. I. Principles

1 March 1993

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Design & Test of Computers

Vol. 10 (1) , 73-82
https://doi.org/10.1109/54.199807

Abstract

An overview of built-in self-test (BIST) principles and practices is presented. The issues and economics underlying BIST are discussed, and the related hierarchical test structures are introduced. The fundamental BIST concepts of pattern generation and response analysis are explained. Linear feedback shift register theory is reviewed.<>

Keywords

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