Economic effects in design and test
- 1 December 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Design & Test of Computers
- Vol. 8 (4) , 64-77
- https://doi.org/10.1109/54.107206
Abstract
The authors argue that because of misconceptions and myths about the cost of test, many devices and systems are inadequately tested. Focusing on application-specific integrated circuits (ASICs), the authors discuss the economics of test and show how economic analysis leads to test that pays back. The EVEREST test strategy planner, a design tool that aids in the selection of design-for-testability structures during ASIC design and uses cost as a primary selection parameter, is presented.Keywords
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