Macro Testability; The Results of Production Device Applications

This publication has 16 references indexed in Scilit:

• Test Propagation Through Modules and Circuits
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• The testability of a modified Booth multiplier
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• Fault modeling and test algorithm development for static random access memories
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• The design of a competitive ASIC for the consumer market using the PIRAMID design system
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• Hierarchical test assembly for macro based VLSI design
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Macro-testability and the VSP
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Reorganizing circuits to aid testability
  IEEE Design & Test of Computers, 1991
• Logic synthesis. A faster route to silicon
  IEE Review, 1989
• Macro Testing: Unifying IC And Board Test
  IEEE Design & Test of Computers, 1986
• Fault Analysis and Test Generation for Programmable Logic Arrays (PLA's)
  IEEE Transactions on Computers, 1979