Epitaxial growth and electrical conductance of metal(CoSi2)/insulator(CaF2) nanometer-thick layered structures on Si (111)
- 1 August 1992
- journal article
- Published by Springer Nature in Journal of Electronic Materials
- Vol. 21 (8) , 783-789
- https://doi.org/10.1007/bf02665516
Abstract
No abstract availableKeywords
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