Determination of trap parameters in electrodeposited CdTe by schottky barrier capacitance measurements
- 1 April 1981
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 78 (3) , 217-222
- https://doi.org/10.1016/0040-6090(89)90586-5
Abstract
No abstract availableKeywords
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