On the C-Testability of Generalized Counters
- 1 September 1987
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 6 (5) , 713-726
- https://doi.org/10.1109/tcad.1987.1270317
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- The Design of Easily Testable VLSI Array MultipliersIEEE Transactions on Computers, 1984
- Design of Testable Structures Defined by Simple LoopsIEEE Transactions on Computers, 1981
- A Testable Design of Iterative Logic ArraysIEEE Transactions on Computers, 1981
- Diagnosis of Faults in Linear Tree NetworksIEEE Transactions on Computers, 1977
- Truth-Table Verification of an Iterative Logic ArrayIEEE Transactions on Computers, 1976
- Easily Testable Iterative SystemsIEEE Transactions on Computers, 1973
- Testing for faults in combinational cellular logic arraysPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1967