Note on Self-Checking Checkers
- 1 October 1974
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-23 (10) , 1100-1102
- https://doi.org/10.1109/T-C.1974.223811
Abstract
Totally self-checking checkers for k-out-of-(2k + 1), (k + 1)-out-of-(2k + 1), and k-out-of-2k codes are given. The new checkers for the k-out-of-2k codes require only 2k tests to detect all stuck-at faults.Keywords
This publication has 5 references indexed in Scilit:
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- Complete Test Sets for Logic FunctionsIEEE Transactions on Computers, 1973
- Universal Test Sets for Logic NetworksIEEE Transactions on Computers, 1973
- Design of Totally Self-Checking Check Circuits for m-Out-of-n CodesIEEE Transactions on Computers, 1973
- Logic Design for Dynamic and Interactive RecoveryIEEE Transactions on Computers, 1971