Increasing fault coverage for synchronous sequential circuits by the multiple observation time test strategy
- 10 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- An optimal test sequence for the JTAG/IEEE P1149.1 test access port controllerPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Fast test generation for sequential circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Test generation for sequential circuits using individual initial value propagationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- CONTEST: a concurrent test generator for sequential circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Test generation for synchronous sequential circuits using multiple observation timesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- HITEC: a test generation package for sequential circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Functional test generation for finite state machinesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Gentest: an automatic test-generation system for sequential circuitsComputer, 1989
- Test generation for sequential circuitsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988
- An effective test generation system for sequential circuitsPublished by Association for Computing Machinery (ACM) ,1986