Low Frequency Noise Measurements of GaAs FETs
- 23 March 2005
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 86, 79-82
- https://doi.org/10.1109/mwsym.1986.1132114
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Profile studies of ion-implanted MESFET'sIEEE Transactions on Electron Devices, 1983
- Low frequency noise physical analysis for the improvement of the spectral purity of GaAs FETs oscillatorsSolid-State Electronics, 1982
- Signal and Noise Properties of Gallium Arsenide Microwave Field-Effect TransistorsPublished by Elsevier ,1975
- Theory of low-frequency generation noise in junction-gate field-effect transistorsProceedings of the IEEE, 1964
- Gate noise in field effect transistors at moderately high frequenciesProceedings of the IEEE, 1963