Low frequency noise physical analysis for the improvement of the spectral purity of GaAs FETs oscillators
- 31 May 1982
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 25 (5) , 367-374
- https://doi.org/10.1016/0038-1101(82)90121-6
Abstract
No abstract availableKeywords
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