Coupled Electron-Hole Dynamics at theInterface
- 9 November 1998
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 81 (19) , 4224-4227
- https://doi.org/10.1103/physrevlett.81.4224
Abstract
We report a new and surprising enhancement of the electric field at the interface following the cessation of intense pulsed near-infrared radiation. The phenomenon, measured by optical second-harmonic generation, occurs only for photon energies and oxide film thickness that exceed respective thresholds. We attribute the new effect to multiphoton hole injection into the oxide and to an asymmetry in electron and hole dynamics, in particular to distinctly different trapping and detrapping processes.
Keywords
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