Application of Heavy Charged Particle Induced X-Ray Emission to the Trace Element Analysis of Human Tissue and Blood Serum
- 1 January 1975
- book chapter
- Published by Springer Nature
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
- Proton induced X-ray emission as a tool for trace element analysisNuclear Instruments and Methods, 1974
- Trace element analysis using proton-induced X-ray emission spectroscopyNuclear Instruments and Methods, 1974
- Choice of physical parameters in charged particle induced X-ray fluorescence analysisThe International Journal of Applied Radiation and Isotopes, 1973
- Target backings for charged particle induced X-ray fluorescence analysisNuclear Instruments and Methods, 1973
- A comparative study of alpha and X-ray induced X-ray emission for elemental analysisNuclear Instruments and Methods, 1973
- Comparison of particle and photon excited X-ray fluorescence applied to trace element measurements of environmental samplesNuclear Instruments and Methods, 1973
- Sensitivity versus target backings for elemental analysis by alpha excited X-ray emissionNuclear Instruments and Methods, 1972
- An investigation of the analytical capabilities of X-ray emission induced by high energy alpha particlesNuclear Instruments and Methods, 1971
- X-ray analysis: Elemental trace analysis at the 10−12 g levelNuclear Instruments and Methods, 1970
- Photon cross sections from 1 keV to 100 MeV for elements Z=1 to Z=100Atomic Data and Nuclear Data Tables, 1970