Measurement and model for correlating phase and baseband 1/f noise in an FET
- 1 January 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 42 (11) , 2051-2055
- https://doi.org/10.1109/22.330118
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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