An experimental chip to evaluate test techniques experiment results
Top Cited Papers
- 19 November 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 10893539,p. 663-672
- https://doi.org/10.1109/test.1995.529895
Abstract
This paper describes the testing of a chip especially designed to facilitate the evaluation of various test techniques for combinational circuitry. The different test sets and test conditions are described. Several tables show the results of voltage tests applied, either at rated speed or 2/3 speed, to each defective CUT. Data for CrossCheck, Very-Low-Voltage, IDDQ and delay tests are also given.Keywords
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