Raman enhancement methods for molecular structure characterization of optical thin films
- 1 November 1987
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 154 (1) , 257-270
- https://doi.org/10.1016/0040-6090(87)90370-1
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Interference-enhanced Raman scattering from TiO_2/SiO_2 multilayers: measurement and theoryApplied Optics, 1987
- Structure of very thin TiO2 films studied by Raman spectroscopy with interference enhancementThin Solid Films, 1986
- Substrate signal suppression in Raman spectra of sputter deposited TiO2 filmsThe Journal of Chemical Physics, 1984
- Reduction of substrate interference in Raman spectroscopy of submicron titania coatingsApplied Optics, 1984
- Raman characterization of all-dielectric multilayer SiO_2/TiO_2 optical coatingsApplied Optics, 1984
- Structural characterization of TiO_2 optical coatings by Raman spectroscopyApplied Optics, 1983
- Excited state geometry changes from preresonance Raman intensities: Isoprene and hexatrieneThe Journal of Chemical Physics, 1982
- Simple aspects of Raman scatteringThe Journal of Physical Chemistry, 1982
- Interference-Enhanced Raman Scattering of Very Thin Titanium and Titanium Oxide FilmsPhysical Review Letters, 1980
- Interference enhanced Raman scattering from very thin absorbing filmsApplied Physics Letters, 1980