Strain relief and its effect on the properties of GaN using isoelectronic In doping grown by metalorganic vapor phase epitaxy
- 27 December 1999
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 75 (26) , 4106-4108
- https://doi.org/10.1063/1.125551
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Improvements of the Optical and Electrical Properties of GaN Films by Using In-doping Method During GrowthJapanese Journal of Applied Physics, 1999
- Stress and Defect Control in GaN Using Low Temperature InterlayersJapanese Journal of Applied Physics, 1998
- Isoelectronic In-doping effect in GaN films grown by metalorganic chemical vapor depositionApplied Physics Letters, 1998
- Reduction of Etch Pit Density in Organometallic Vapor Phase Epitaxy-Grown GaN on Sapphire by Insertion of a Low-Temperature-Deposited Buffer Layer between High-Temperature-Grown GaNJapanese Journal of Applied Physics, 1998
- Thick GaN Epitaxial Growth with Low Dislocation Density by Hydride Vapor Phase EpitaxyJapanese Journal of Applied Physics, 1997
- Optical Properties of Strained AlGaN and GaInN on GaNJapanese Journal of Applied Physics, 1997
- Metalorganic vapor phase epitaxial growth of a high quality GaN film using an AlN buffer layerApplied Physics Letters, 1986