Inelastic electron tunneling spectroscopy and atomic force microscopy investigation of ultrathin sputtered amorphous silica films on gold
- 1 March 1993
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 73 (5) , 2347-2352
- https://doi.org/10.1063/1.353112
Abstract
No abstract availableThis publication has 29 references indexed in Scilit:
- FTIR studies of H2O and D2O decomposition on porous silicon surfacesPublished by Elsevier ,2002
- Infrared ellipsometry study of the oxidation mechanisms of hydrogenated amorphous siliconSurface Science, 1992
- Charge transfer across metal-SiO2interfacesJournal of Physics D: Applied Physics, 1991
- Composition and structure of semi-insulating polycrystalline silicon thin filmsPhilosophical Magazine Part B, 1990
- Silicon oxide epitaxial films investigated by neutron reflectivityJournal of Physics D: Applied Physics, 1989
- Hydrogen desorption kinetics from monohydride and dihydride species on silicon surfacesPhysical Review B, 1988
- Conduction mechanisms in polysiloxane films deposited by microwave glow dischargeJournal of Applied Physics, 1985
- Comparison of the neutron, Raman, and infrared vibrational spectra of vitreous Si, Ge, and BePhysical Review B, 1983
- Oxidation and interface states in a-Si: HPhilosophical Magazine Part B, 1981
- Structural interpretation of the vibrational spectra of-Si: H alloysPhysical Review B, 1979