Measurement of cube-root broadening of charge packets in metal-oxide- semiconductor structures
- 1 May 1983
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 42 (9) , 815-817
- https://doi.org/10.1063/1.94106
Abstract
The spatial width of electron packets drifting in a nearly uniform electric field in a metal-oxide-semiconductor structure is determined from flux pulse measurements. The width is found to broaden as the cube root of time, thus verifying an earlier prediction. Furthermore, the broadening rate constant is found to agree with that predicted to within 7%.Keywords
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