Cosmic ray effects in microelectronics

This publication has 10 references indexed in Scilit:

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  IEEE Transactions on Nuclear Science, 1984
• A New Class of Single Event Soft Errors
  IEEE Transactions on Nuclear Science, 1984
• Single Event Upset Rate Predictions for Complex Logic Systems
  IEEE Transactions on Nuclear Science, 1984
• Investigation of Heavy Particle Induced Latch-Up, Using a Californium-252 Source, in CMOS SRAMs and PROMs
  IEEE Transactions on Nuclear Science, 1984
• A Summary of JPL Single Event Upset Test Data from May 1982, Through January 1984
  IEEE Transactions on Nuclear Science, 1984
• Single Event Upset (SEU) of Semiconductor Devices - A Summary of JPL Test Data
  IEEE Transactions on Nuclear Science, 1983
• Cosmic Ray Simulation Experiments for the Study of Single Event Upsets and Latch-Up in CMOS Memories
  IEEE Transactions on Nuclear Science, 1983
• The Variability of Single Event Upset Rates in the Natural Environment
  IEEE Transactions on Nuclear Science, 1983
• Single Event Error Immune CMOS RAM
  IEEE Transactions on Nuclear Science, 1982
• Satellite Anomalies from Galactic Cosmic Rays
  IEEE Transactions on Nuclear Science, 1975