A Nonlinear Eigenvalue Problem Modelling the Avalanche Effect in Semiconductor Diodes
- 1 November 1985
- journal article
- Published by Society for Industrial & Applied Mathematics (SIAM) in SIAM Journal on Mathematical Analysis
- Vol. 16 (6) , 1268-1283
- https://doi.org/10.1137/0516091
Abstract
This paper is concerned with the analysis of the solution set of the two-point boundary value problem modelling the avalanche effect in semiconductor diodes for negative applied voltage. This effect is represented by a large increase of the absolute value of the current starting at a certain reverse basis. We interpret the avalanche model as a-nonlinear eigenvalue problem (with the current as eigenparameter) and show (using a priori estimates and a well-known theorem on the structure of solution sets of nonlinear eigenvalue problems for compact operators) that there exists an unbounded continuum of solutions which contains a solution for every negative voltage. Therefore, the solution branch does not “break down” at a certain threshold voltage (as expected on physical grounds). We discuss the current-voltage characteristic and prove that the absolute value of the current increases at most (and at least) exponentially in the avalanche case as the voltage decreases to minus infinity.Keywords
This publication has 6 references indexed in Scilit:
- A Singular Perturbation Analysis of the Fundamental Semiconductor Device EquationsSIAM Journal on Applied Mathematics, 1984
- A Singularly Perturbed Boundary Value Problem Modelling a Semiconductor DeviceSIAM Journal on Applied Mathematics, 1984
- A two-dimensional model of the avalanche effects in MOS transistorsSolid-State Electronics, 1982
- An asymptotic theory for a class of nonlinear Robin problemsJournal of Differential Equations, 1978
- Some global results for nonlinear eigenvalue problemsJournal of Functional Analysis, 1971
- Theory of the Flow of Electrons and Holes in Germanium and Other SemiconductorsBell System Technical Journal, 1950