Monitoring power dissipation for fault detection
- 23 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Fault Detection And Input Stimulus Determination For The Testing Of Analog Integrated Circuits Based On Power-supply Current MonitoringPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Built-in current testing-feasibility studyPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Power constraint scheduling of testsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Detection and location of faults and defects using digital signal processingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- An approach to dynamic power consumption current testing of CMOS ICsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Transient power supply current monitoring?A new test method for CMOS VLSI circuitsJournal of Electronic Testing, 1995
-
i
DD
, pulse response testing: A unified approach to testing digital and analogue ICsElectronics Letters, 1993
- Fault Modeling and Logic Simulation of CMOS and MOS Integrated CircuitsBell System Technical Journal, 1978