Transient power supply current monitoring?A new test method for CMOS VLSI circuits
- 1 February 1995
- journal article
- Published by Springer Nature in Journal of Electronic Testing
- Vol. 6 (1) , 23-43
- https://doi.org/10.1007/bf00993128
Abstract
No abstract availableKeywords
This publication has 20 references indexed in Scilit:
- STUCK FAULT AND CURRENT TESTING COMPARISON USING CMOS CHIP TESTPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- THE BEHAVIOR AND TESTING IMPLICATIONS OF CMOS IC LOGIC GATE OPEN CIRCUITSPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Electrical properties and detection methods for CMOS IC defectsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Fault detection of combinational circuits based on supply currentPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Circuit design for built-in current testingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A comparison of methods for supply current analysisPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- I DDQ testing as a component of a test suite: The need for several fault coverage metricsJournal of Electronic Testing, 1992
- Testing of static random access memories by monitoring dynamic power supply currentJournal of Electronic Testing, 1992
- Realistic fault modeling for VLSI testingPublished by Association for Computing Machinery (ACM) ,1987
- Test Considerations for Gate Oxide Shorts in CMOS ICsIEEE Design & Test of Computers, 1986