In situ monitoring of a laser-induced etched grating on InP: Thin-film cell configuration
- 31 December 1990
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 57 (27) , 2959-2961
- https://doi.org/10.1063/1.103739
Abstract
On‐line, first‐order light diffraction from a laser‐induced etched grating in a thin‐film cell configuration is investigated. It is suggested that a layer of dissolved reaction products interferes with the in situ light scattering measurements.Keywords
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