Observations on charging effects of non-conductive and uncoated materials by ion beam pre-bombardment in scanning electron microscopy
- 31 December 1992
- journal article
- Published by Elsevier in Micron and Microscopica Acta
- Vol. 23 (3) , 319-335
- https://doi.org/10.1016/0739-6260(92)90034-b
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- Quantitative analysis of sputtering due to ion beam bombardment of solids and biological specimens in high resolution electron microscopyMicron and Microscopica Acta, 1992
- Backscattered electron imaging. Its application to biological specimens stained with heavy metals.Archivum histologicum japonicum, 1986
- Application of a backscattered electron image to immunocytochemistry in freeze-cracked tissues.Archivum histologicum japonicum, 1984
- Charge neutralisation of insulating surfaces in the SEM by gas ionisationJournal of Physics D: Applied Physics, 1978
- High resolution shadowing for electron microscopy by sputter depositionUltramicroscopy, 1977
- Modified Tannin-Osmium Conductive Staining Method for Non-Coated Scanning Electron Microscope Specimens. Its Application to Microdissection Scanning Electron Microscopy of the SpleenArchivum histologicum japonicum, 1977
- Charging Effect of Specimen in Scanning Electron MicroscopyJapanese Journal of Applied Physics, 1974
- Penetration and energy-loss theory of electrons in solid targetsJournal of Physics D: Applied Physics, 1972
- Retarding field scanning electron microscopyJournal of Physics E: Scientific Instruments, 1968
- ENZYME-LABELED ANTIBODIES: PREPARATION AND APPLICATION FOR THE LOCALIZATION OF ANTIGENSJournal of Histochemistry & Cytochemistry, 1966