Characterization of self-assembled Ge islands on Si(100) by atomic force microscopy and transmission electron microscopy
- 1 May 1998
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 321 (1-2) , 86-91
- https://doi.org/10.1016/s0040-6090(98)00453-2
Abstract
No abstract availableFunding Information
- Bundesministerium für Bildung und Forschung (01 M 2953 A)
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