Errors in Electron Microscope Determinations of Foil Thickness from Measurements of Trace Widths
- 16 December 1975
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 32 (2) , 529-532
- https://doi.org/10.1002/pssa.2210320223
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- The determination of foil thickness by scanning transmission electron microscopyPhysica Status Solidi (a), 1975
- On the accuracy of orientation determination by selected area electron diffractionPhilosophical Magazine, 1968
- The uniqueness of orientation determination by selected area electron diffractionPhilosophical Magazine, 1967
- Calibration and Use of an Electron Microscope for Precision Micromeasurements in Thin Film MaterialsPhysica Status Solidi (b), 1967
- Electron Microscopy and Diffraction of Thin Films: Interpretation and Correlation of Images and Diffraction PatternsPhysica Status Solidi (b), 1964