Surface and interface depletion corrections to free carrier-density determinations by hall measurements
- 31 July 1979
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 22 (7) , 645-650
- https://doi.org/10.1016/0038-1101(79)90138-2
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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