Heavy ion and proton-induced single event multiple upset
- 1 December 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 44 (6) , 2224-2229
- https://doi.org/10.1109/23.659039
Abstract
No abstract availableThis publication has 24 references indexed in Scilit:
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