Test CMOS/SOS RAM for transient radiation upset comparative research and failure analysis
- 1 December 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 42 (6) , 2138-2142
- https://doi.org/10.1109/23.489264
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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