Long lossy lines (L/sup 3/) and their impact upon large chip performance
- 1 January 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B
- Vol. 20 (4) , 361-375
- https://doi.org/10.1109/96.641504
Abstract
No abstract availableKeywords
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