Energy spectra of secondary electrons induced by fast ions under channeling conditions
Open Access
- 1 July 1988
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 38 (1) , 44-49
- https://doi.org/10.1103/physrevb.38.44
Abstract
We have studied simple aspects of the energy spectra of ion-induced secondary electrons emitted from single crystals under channeling conditions. The energy spectra for Si and GaAs targets, measured at a backward angle of 180° for various incident ions over a 2–8 MeV/amu energy range, showed a constant decrease in the electron yield over certain keV energy regions when channeling occurred. This behavior was interpreted as a decrease in the effective target thickness, resulting from the ion-beam shadowing effect near crystal surfaces.Keywords
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