Experimental study of negative photoconductivity inn-PbTe(Ga) epitaxial films

We report on low-temperature photoconductivity (PC) in $n-\mathrm{PbTe}\left(\mathrm{Ga}\right)$ epitaxial films prepared by the hot-wall technique on $〈111〉-{\mathrm{BaF}}_2$ substrates. Variation of the substrate temperature allowed us to change the resistivity of the films from ${10}^8$ down to ${10}^{-2}\hspace{0.5em}\Omega \hspace{0.5em}\mathrm{cm}$ at 4.2 K. The resistivity reduction is associated with a slight excess of Ga concentration, disturbing the Fermi level pinning within the energy gap of $n-\mathrm{PbTe}\left(\mathrm{Ga}\right).\mathrm{}$ PC has been measured under continuous and pulse illumination in the temperature range 4.2–300 K. For films of low resistivity, the photoresponse is composed of negative and positive parts. Recombination processes for both effects are characterized by nonexponential kinetics depending on the illumination pulse duration and intensity. Analysis of the PC transient proves that the negative photoconductivity cannot be explained in terms of nonequilibrium charge carriers spatial separation of due to band modulation. Experimental results are interpreted assuming the mixed valence of Ga in lead telluride and the formation of centers with a negative correlation energy. Specifics of the PC process is determined by the energy levels attributed to donor ${\mathrm{Ga}}^{\mathrm{III}},$ acceptor ${\mathrm{Ga}}^I,$ and neutral ${\mathrm{Ga}}^{\mathrm{II}}$ states with respect to the crystal surrounding. The energy level corresponding to the metastable state ${\mathrm{Ga}}^{\mathrm{II}}$ is supposed to occur above the conduction band bottom, providing fast recombination rates for the negative PC. The superposition of negative and positive PC’s is considered to be dependent on the ratio of the densities of states corresponding to the donor and acceptor impurity centers.