Performance trade-offs in a parallel test generation/fault simulation environment
- 1 January 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 10 (12) , 1542-1558
- https://doi.org/10.1109/43.103504
Abstract
No abstract availableThis publication has 22 references indexed in Scilit:
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