Slit morphology of electromigration induced open circuit failures in fine line conductors
- 1 October 1992
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 72 (7) , 3201-3203
- https://doi.org/10.1063/1.351484
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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