Annealing of degraded npn-transistors-mechanisms and modeling
- 1 April 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 41 (4) , 533-538
- https://doi.org/10.1109/16.278506
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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