Atomic Force Microscopy and Infrared Spectroscopy Studies of the Thermal Degradation of Nomex Aramid Fibers
Open Access
- 24 October 2001
- journal article
- research article
- Published by American Chemical Society (ACS) in Chemistry of Materials
- Vol. 13 (11) , 4297-4304
- https://doi.org/10.1021/cm001219f
Abstract
No abstract availableKeywords
This publication has 26 references indexed in Scilit:
- Atomic force microscopy investigation of the surface modification of highly oriented pyrolytic graphite by oxygen plasmaJournal of Materials Chemistry, 2000
- Scanning Probe MicroscopyAnalytical Chemistry, 2000
- Surface Film Formation by Chemical Vapor Deposition of Di-p-xylylene: Ellipsometrical, Atomic Force Microscopy, and X-ray StudiesLangmuir, 2000
- Developments and perspectives of scanning probe microscopy (SPM) on organic materials systemsMaterials Science and Engineering: R: Reports, 1998
- Processing of Blue Boron Nitride Thin Films with a Solid–Gas ReactionChemistry – A European Journal, 1996
- Deformation, Contact Time, and Phase Contrast in Tapping Mode Scanning Force MicroscopyLangmuir, 1996
- Nitrogenation of Silicon Carbide Layers Deposited on Silicon Single-Crystal Wafers via Pyrolysis of Poly(methylsilane)Chemistry of Materials, 1995
- Adsorption of nitrogen and water vapour by activated Nomex® charsCarbon, 1995
- Aromatic polyamides. II. Thermal degradation of some aromatic polyamides and their model diamidesJournal of Polymer Science: Polymer Chemistry Edition, 1981
- Thermal degradation of isomeric aromatic polyamidesPolymer Science U.S.S.R., 1966