Schottky barrier height enhancement of n-In0.53Ga0.47As by a novel chemical passivation technique

Abstract
A novel method of enhancing Schottky barrier height, while reducing the surface‐state density on n‐type In0.53Ga0.47 As surfaces using P2S5/(NH4)2S and (NH4)2Sx passivation is described in this communication. The current‐voltage and capacitance‐voltage characteristics show that passivated diodes have lower reverse leakage current and higher effective barrier height than that of the unpassivated diodes. The electrical characteristics of passivated diodes have not changed after one month of exposure to the air.