Reliability of semiconductor lasers and detectors for undersea transmission systems
- 1 December 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Journal of Lightwave Technology
- Vol. 2 (6) , 945-951
- https://doi.org/10.1109/jlt.1984.1073716
Abstract
This paper reports the strategy for establishing the reliability assurance for LD's and APD's available for undersea transmission systems. On the basis of aging data during more than 104h and a statistical analysis for the reliability of semiconductor devices, the LD's and Ge-APD's lifetest plans for high reliability assurance are proposed.Keywords
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